Session Chairs:

Jeff Mills, University of Cincinnati

Papers:

"Truncated Product Methods for Panel Unit Root Tests"
Xuguang Sheng, American University (Contact Author)
Jingyun Yang, The University of Oklahoma

"Flexible Bivariate Count Data Regression Models"
Shiferaw Gurmu, Georgia State University (Contact Author)
John Elder, Colorado State University

"A Robust, Uniformly Most Powerful Unit Root Test"
Jeff Mills, University of Cincinnati (Contact Author)

"Random Effects, Fixed Effects and Hausman's Test for the Generalized Spatial Panel Data Regression Model"
Badi Baltagi, Syracuse University (Contact Author)
Long Liu, The University of Texas at San Antonio

Discussants:

Shiferaw Gurmu, Georgia State University
Xuguang Sheng, American University
Andrew Travis Balthrop, Georgia State University
Long Liu, The University of Texas at San Antonio

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